发明名称 |
CHARGED PARTICLE BEAM DEVICE AND METHOD OF GENERATING CHARGED PARTICLE BEAM IMAGE |
摘要 |
PROBLEM TO BE SOLVED: To eliminate an effect of electrostatic charge due to electron beam irradiation by a simple structure. SOLUTION: The effect of the electrostatic charge is eliminated or suppressed by varying the landing energy of the primary electron beam at the time of exchange of swing back of electronic line scanning. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2008262882(A) |
申请公布日期 |
2008.10.30 |
申请号 |
JP20070106654 |
申请日期 |
2007.04.16 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
KOYAMA HIKARI;NAKAYAMA YOSHINORI;HAYATA YASUNARI;TEI TOMOKI;YANO TASUKU;FURUKAWA TAKASHI |
分类号 |
H01J37/28 |
主分类号 |
H01J37/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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