| 摘要 |
PROBLEM TO BE SOLVED: To efficiently select a non-defective article of a DAC and an ADC in a BB-LSI wherein the DAC and the ADC are mounted. SOLUTION: For example, a predetermined test signal is generated by a test signal generation part 13 according to a test start request. D/A conversion is performed on the test signal by a D/A converter 14, and then, the test signal is transmitted to an A/D converter 15 via a crossline 21. The signal on which A/D conversion is performed by the A/D converter 15 is transmitted to a self-correlation operation part 17 so as to find a self-correlation function F(τ). Conformity of this operation result F(τ) with a reference signal from a reference signal generation part 19 is evaluated by a conformity evaluation part 18, and the result is used for selecting the non-defective article of the D/A converter 14 and the A/D converter 15. COPYRIGHT: (C)2009,JPO&INPIT
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