Apparatus and method for determining on die termination modes in memory device

摘要

For determining an on die termination (ODT) mode in a semiconductor memory device, a first mode determining unit determines whether or not a normal ODT mode is enabled from performing a logic operation on a first set of signals. A second mode determining unit determines whether or not a dynamic ODT mode test is enabled from performing a logic operation on a second set of signals. One of the normal and dynamic ODT modes is enabled with more flexibility.