发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit having a layout capable of achieving the stabilization of gate protective characteristics and an improvement in the degree of integration of the integrated circuit without using a Zener diode having a plurality of breakdown voltages corresponding to the gate breakdown voltage of a transistor. SOLUTION: The semiconductor integrated circuit has a high breakdown voltage output circuit having a push-pull circuit consisting of a high-side transistor and a low-side transistor, a level shift circuit and a gate protective circuit. The gate protective circuit has a voltage-dividing resistor dividing the breakdown voltage by the Zener diode and the Zener diode consisting of a P-type impurity region doped by P-type impurities. The voltage-dividing resistor is arranged so as to be surrounded by an N-type impurity region doped by N-type impurities. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008243910(A) 申请公布日期 2008.10.09
申请号 JP20070078778 申请日期 2007.03.26
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MATSUNAGA HIROKI;YOSHIDA SEIYA;KANEDA JINSAKU;NAKAMURA EMI
分类号 H01L21/822;H01L27/04;H01L27/06;H01L27/08 主分类号 H01L21/822
代理机构 代理人
主权项
地址