发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit having a layout capable of achieving the stabilization of gate protective characteristics and an improvement in the degree of integration of the integrated circuit without using a Zener diode having a plurality of breakdown voltages corresponding to the gate breakdown voltage of a transistor. SOLUTION: The semiconductor integrated circuit has a high breakdown voltage output circuit having a push-pull circuit consisting of a high-side transistor and a low-side transistor, a level shift circuit and a gate protective circuit. The gate protective circuit has a voltage-dividing resistor dividing the breakdown voltage by the Zener diode and the Zener diode consisting of a P-type impurity region doped by P-type impurities. The voltage-dividing resistor is arranged so as to be surrounded by an N-type impurity region doped by N-type impurities. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2008243910(A) |
申请公布日期 |
2008.10.09 |
申请号 |
JP20070078778 |
申请日期 |
2007.03.26 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
MATSUNAGA HIROKI;YOSHIDA SEIYA;KANEDA JINSAKU;NAKAMURA EMI |
分类号 |
H01L21/822;H01L27/04;H01L27/06;H01L27/08 |
主分类号 |
H01L21/822 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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