发明名称 Lithographic apparatus and method
摘要 A device manufacturing method includes conditioning a beam of radiation using an illumination system. The conditioning includes controlling an array of individually controllable elements (33a-33e) and associated optical components (16) of the illumination system to convert the radiation beam into a desired illumination mode, the controlling including allocating different individually controllable elements to different parts of the illumination mode in accordance with an allocation scheme, the allocation scheme selected to provide a desired modification of one or more properties of the illumination mode, the radiation beam or both. The method also includes patterning the radiation beam with a pattern in its cross-section to form a patterned beam of radiation, and projecting the patterned radiation beam onto a target portion of a substrate.
申请公布号 EP1975724(A1) 申请公布日期 2008.10.01
申请号 EP20080250946 申请日期 2008.03.18
申请人 ASML NETHERLANDS BV 发明人 MULDER, HEINE MELLE;BASELMANS, JOHANNES JACOBUS MATHEUS;ENGELEN, ADRIANUS FRANCISCUS PETRUS;EURLINGS, MARKUS FRANCISCUS ANTONIUS;VAN GREEVENBROEK, HENDRIKUS ROBERTUS MARIE;TINNEMANS, PATRICIUS ALOYSIUS JACOBUS;VAN DER VEEN, PAUL;ENDENDIJK, WILFRED EDWARD
分类号 G03F7/20 主分类号 G03F7/20
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