发明名称 |
Failure analysis and testing of semi-conductor devices using intelligent software on automated test equipment (ATE) |
摘要 |
The invention provides a number of related methods which improve the test and analysis of integrated circuit devices. A first method of the invention provides a method for pausing on a SCAN based test. A second method of the invention provides a method for using stimulations and responses of a known good device to increase fault coverage of patterns in a test flow. A third method of the invention provides a method to curve trace device buffers on an ATE.
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申请公布号 |
US7430700(B2) |
申请公布日期 |
2008.09.30 |
申请号 |
US20070670031 |
申请日期 |
2007.02.01 |
申请人 |
LSI LOGIC CORPORATION |
发明人 |
YACOBUCCI ROGER |
分类号 |
G06F11/00;G01R31/28;G06F17/50 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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