发明名称 Strained semiconductor by wafer bonding with misorientation
摘要 One aspect of the present invention relates to a method for forming a strained semiconductor structure. In various embodiments, at least two strong bonding regions are defined for a desired bond between a crystalline semiconductor membrane and a crystalline semiconductor substrate. The two strong bonding regions are separated by a weak bonding region. The membrane is bonded to the substrate at a predetermined misorientation. The membrane is pinned to the substrate in the strong bonding regions. The predetermined misorientation provides the membrane in the weak bonding region with a desired strain. In various embodiments, the membrane is bonded to the substrate at a predetermined twist angle to biaxially strain the membrane in the weak bonding region. In various embodiments, the membrane is bonded to the substrate at a predetermined tilt angle to uniaxially strain the membrane in the weak bonding region. Other aspects are provided herein.
申请公布号 US7429763(B2) 申请公布日期 2008.09.30
申请号 US20050318124 申请日期 2005.12.23
申请人 MICRON TECHNOLOGY, INC. 发明人 FORBES LEONARD
分类号 H01L29/76;H01L21/18;H01L29/04;H01L29/32 主分类号 H01L29/76
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