| 摘要 |
A socket for a test is provided to support respective probes by using a metal block and connect a probe for a ground to the metal block certainly and electrically. A metal block(2) has the first surface and the second surface different from the first surface. The metal block(2) has a plurality of through holes(21). A plurality of probes(1) is installed in the through holes(21). A plurality of the probes(1) is electrically connected to a terminal of a tested device installed at the first surface side and a terminal connected to a testing device installed at the second surface side. A plurality of the probes(1) has the first probe(1GND) for a ground and the second probe different from the first probe(1GND). A ground plate(5) has the first hole, a groove, and the second hole. The first hole, corresponding to the first probe(1GND), has a diameter which is narrower than a diameter of the first probe(1GND). The groove is extended from the first hole to a diameter direction. The second hole, corresponding to the second probe, has a diameter which is broader than a diameter of the second probe. The ground plate(5) is electrically contacted with the metal block(2). |
