发明名称 PROJECTION OBJECTIVE OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
摘要 <p>A projection objective (100) of a microlithographic projection exposure apparatus, serving to project an image of a mask that can be set in position in an object plane (OP) onto a light-sensitive coating layer that can be set in position in an image plane (IP), wherein the projection objective is designed to operate in an immersion mode, produces at least one intermediate image (IMI) and comprises an optical subsystem (130) on the image-plane side which projects said intermediate image (IMI) into the image plane with an image-plane-side projection ratio betai, wherein said image-plane-side projection ration betai,has an absolute value of at least 0.3.</p>
申请公布号 KR20080077356(A) 申请公布日期 2008.08.22
申请号 KR20087012094 申请日期 2008.05.20
申请人 CARL ZEISS SMT AG 发明人 BEDER SUSANNE;KRAHMER DANIEL;FELDMANN HEIKO
分类号 H01L21/027 主分类号 H01L21/027
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