| 摘要 |
PROBLEM TO BE SOLVED: To provide an electronic component inspection vessel capable of making inspection process of the electronic components high precision and simplification. SOLUTION: In an upper vessel 11 and a lower vessel 12 which consist of a hermetically sealed vessel by being abutted to each other, the conductive socket 72 is fitted while securing insulation to the plurality of socket fixing holes provided on either one of the upper vessel 11 or lower vessel 12. In the conductive socket 72 to the bottomed hole for fixing the probe, the probe 73 is made to fit interchangeably. The conductive socket 72 is also provided with data leading out wires extending out of the vessel from the bottom of the probe fixing hole. As the results, when the upper vessel 11 and the lower vessel 12 are superimposed, the inspection terminals of an inspecting electronic components A are constituted so as to be in contact with the probe 73. COPYRIGHT: (C)2008,JPO&INPIT
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