发明名称 INSPECTION DEVICE FOR IMAGE PICKUP DEVICE AND INSPECTION METHOD FOR IMAGE PICKUP DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an inspection device for an image pickup device easily inspecting a quality of the tip of each leg part of a shield case provided in an image pickup device. SOLUTION: The inspection device for an image pickup device inspects an image pickup device that is provided with an image pickup lens, a package sensor, which includes an image pickup element and in which a plurality of solder balls to be soldered with a prescribed printed circuit board are arranged in a lattice shape, and a shield case formed of a metal plate so as to cover the package sensor. The inspection device is provided with an inspection jig having a smooth placing face, onto which the image pickup device is placed in contact with the solder balls, at least, an inspection camera for imaging each leg part that is provided under the shield case and used for solder-bonding with the printed circuit board, and a display device that displays each leg part imaged by the inspection camera and in which two parallel discrimination lines for discriminating whether or not each leg part is within a prescribed range are prepared. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008193566(A) 申请公布日期 2008.08.21
申请号 JP20070027838 申请日期 2007.02.07
申请人 KONICA MINOLTA OPTO INC 发明人 KIYOSUE SHIGENORI;KANO MITSUHISA
分类号 G01B11/02;G01N21/956;H01L27/14;H04N5/335;H04N5/372;H04N5/374 主分类号 G01B11/02
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