| 摘要 |
An apparatus for inspecting the contour of a container sidewall (30) includes at least one light source (32, GG) for directing light energy onto the container sidewall and at least one light sensor (38, 72) disposed to receive light energy from the light source reflected from the container sidewall. The light sensor is responsive to such reflected light energy to provide signals indicative of the position of the container sidewall relative to the sensor at at least three locations (54, 56, 58) on the container sidewall spaced from each other in the direction of the container axis. An information processor (40) is responsive to such signals to determine the contour of the container sidewall as a function of departure of the sidewall position at one of said three locations from a line between sidewall positions at the other two of said three locations. The other two of said three locations (54, 58) on the container sidewall are preferably adjacent to the container shoulder and the container heel, the one location (56) being between the container shoulder and the container heel. The at least three locations (54, 56, 58) on the container sidewall are preferably nominally aligned with each other in a direction parallel to the container axis. |
