发明名称 CHEMICAL MECHANICAL POLISHING PAD
摘要 <P>PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing pad excellent in polishing speed and in-plane uniformity of polished surface, in which occurrence of scratch is suppressed sufficiently on the polished surface of an article to be polished. <P>SOLUTION: The chemical mechanical polishing pad has a polishing surface consisting of a plurality of regions having a plurality of linear grooves extending in parallel wherein at least one linear groove in each region reaches the end of the polishing surface and the directions of the linear grooves in two adjoining regions are different from each other. <P>COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008187086(A) 申请公布日期 2008.08.14
申请号 JP20070020801 申请日期 2007.01.31
申请人 JSR CORP 发明人 MIYAUCHI HIROYUKI;YAMAMOTO MASAHIRO;SHIBUYA KYOHEI;MOTONARI MASAYUKI;HOSAKA YUKIO
分类号 H01L21/304;B24B37/20 主分类号 H01L21/304
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