发明名称 APPARATUS FOR MEASURING IQ MISMATCH
摘要 An apparatus for measuring IQ mismatch is provided to measure the IQ mismatch by inputting an output signal of an IQ upward conversion mixer into an IQ downward mixer, thereby not being influenced by noises generated in a wireless environment. An apparatus for measuring IQ mismatch includes a signal generation unit for supplying a first IQ signal of DC component for a first period and a first IQ signal of a first angular frequency for a second period. An IQ upward conversion mixer(110) outputs a second IQ signal obtained by up-converting the first IQ signal by a second angular frequency for the first period and outputs a second IQ signal obtained by up-converting the first IQ signal by a third angular frequency. An IQ down conversion mixer(130) outputs a third IQ signal obtained by down-converting the sum of I component signal and Q component signal of the second IQ signal by the third angular frequency. An IQ mismatch measuring unit calculates reception IQ mismatch from the third IQ signal for the first period and calculates the transmission and reception IQ mismatch from the third IQ signal for the second period.
申请公布号 KR20080074267(A) 申请公布日期 2008.08.13
申请号 KR20070013042 申请日期 2007.02.08
申请人 GCT SEMICONDUCTOR, INC. 发明人 LEE, EAL WAN;LEE, SEUNG WOOK;LEE, JEONG WOO;PARK, JOON BAE;LEE, KYEONG HO
分类号 H04L7/00 主分类号 H04L7/00
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