发明名称 ALIGNING APPARATUS, BONDING APPARATUS AND ALIGNING METHOD
摘要 <p>An aligning apparatus by which relative positional shift of electronic components can be corrected surely and alignment precision of them can be enhanced, and a bonding apparatus equipped with the aligning apparatus, and an aligning method. Since an imaging port (21) is projecting inward from the outer surface of a chamber (3) to define a space section (1), an image recognition apparatus (47) can be prevented from interfering with movement of the chamber (3) even when the chamber (3) moves together with a second block member (28) by arranging the image recognition apparatus (47) in the space section (11). Consequently, the chamber (3) can be freely moved without limitation. Since one of a first block member (12) or the second block member (28) can be freely moved relatively to the other without being restricted by the arrangement of the image recognition apparatus (47), alignment of a first wafer and a second wafer held, respectively, by the first block member (12) and the second block member (28) can be carried out surely.</p>
申请公布号 KR20080074173(A) 申请公布日期 2008.08.12
申请号 KR20087014135 申请日期 2006.09.04
申请人 MURATA MANUFACTURING COMPANY, LTD. 发明人 HIRATA ATSUHIKO;FUKUNAGA SHIGEKI;YAMANE SHIGEKI;NAMURA MITSUHIRO;SUZUKI ARATA;WATANABE TOMONARI
分类号 H01L21/68;G02F1/13;H01L21/677 主分类号 H01L21/68
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