发明名称 Memory device
摘要 A phase change memory cell is disclosed. The phase change memory cell includes a first thin film spacer and a second thin film spacer. The first thin film spacer defines a sub-lithographic dimension and is electrically coupled to a first electrode. The second thin film spacer defines a sub-lithographic dimension and is electrically coupled between a second electrode and the first thin film spacer. In this regard, the phase change memory cell is formed at a boundary where the first thin film spacer electrically contacts the second thin film spacer.
申请公布号 US7408240(B2) 申请公布日期 2008.08.05
申请号 US20050120007 申请日期 2005.05.02
申请人 INFINEON TECHNOLOGIES AG 发明人 ZAIDI SHOAIB HASAN
分类号 H01L47/00 主分类号 H01L47/00
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