PROBE UNIT AND INSPECTION APPARATUS

摘要

PROBLEM TO BE SOLVED: To surely prevent a guide film from peeling. SOLUTION: A probe unit and an inspection apparatus for inspecting an object board to be inspected are provided, which comprise: a probe assembly which electrically contacts with an electrode of a circuit of the object board to be inspected and applies an inspection signal thereto; and a connecting cable section for electrically connecting the probe assembly to an external device. The guide film is disposed so as to cover a terminal of an FPC cable with which a needle part of the proximal end of the probe assembly contacts. The guide film is equipped with guide holes whose number is identical to that of terminals of the FPC cable and which are disposed at positions where they fit respective terminals and a folded part which is disposed at a position aligned to a corner part of the distal end section of the FPC plate. COPYRIGHT: (C)2008,JPO&INPIT