TEST CIRCUITS OF SEMICONDUCTOR MEMORY DEVICE FOR MULTI-CHIP TESTING AND METHOD FOR TESTING THE SAME

摘要

A test circuit of a semiconductor memory device for multi-chip test and a test method thereof are provided to reduce test time, by testing a plurality of chips or semiconductor devices at the same time. According to a test circuit of a semiconductor memory device, a first comparison part(140) outputs first comparison signals by comparing read data read in correspondence to an address with data expected to be outputted per bit. A second comparison part(120) generates a flag signal when logic operation of the first comparison signals generates a fail. A storing part(130) stores the first comparison signals in response to the flag signal. The storing part outputs the first comparison signals serially through one input/output line in response to a test clock signal inputted from the outside.