发明名称 DATA VERIFY METHOD AND SEMICONDUCTOR MEMORY DEVICE SELECTIVELY VERIFYING DATA BASED ON THE VALUE OF DATA WRITTEN IN THE MEMORY CELL
摘要 A data verify method for verifying data selectively on the basis of a written data value and a semiconductor memory device thereof are provided to verify data selectively, by enabling a page buffer selectively on the basis of the written data value. A semiconductor memory device comprises at least one memory cell and at least one page buffer(PB1-PBn). The page buffer corresponds to the memory cell, and verifies other bits of data written in a corresponding memory cell except partial bits coinciding with external data. The page buffer comprises a latch part(LU) and a comparison part(COMPU). The latch part latches the partial bits written in the corresponding memory cell. The comparison part compares the latched partial bits with the external data.
申请公布号 KR20080069478(A) 申请公布日期 2008.07.28
申请号 KR20070007245 申请日期 2007.01.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG, DONG KU
分类号 G11C16/34;G11C29/00 主分类号 G11C16/34
代理机构 代理人
主权项
地址