INSULATED GATE SILICON CARBIDE SEMICONDUCTOR DEVICE

摘要

An insulated gate silicon carbide semiconductor device is provided having small on-resistance. The device combines a static induction transistor structure with an insulated gate field effect transistor structure. The advantages of both the SIT structure and the insulated gate field effect transistor structure are obtained. The structures are formed on the same SiC semiconductor substrate, with the MOSFET structure above the SIT structure. The SIT structure includes a p⁺ gate region in an n-type drift layer on an n⁺ SiC semiconductor substrate, and an n⁺ first source region on the surface of the drift layer. The MOSFET structure includes a p-well region on the surface of the first source region, a second source region formed in the p-well region, and a MOS gate structure formed in a trench extending from the second source region to the first source region. The p⁺ gate region and a source electrode are conductively connected.