发明名称 DEVICE AND METHOD FOR EXAMINATION OF SAMPLE IN NON-VACUUM ENVIRONMENT USING SCANNING ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a chamber suitable for use with a scanning electron microscope useful for allowing wet samples to be viewed under an electron microscope. SOLUTION: The chamber (34) is suitable for use with the scanning electron microscope. The chamber contains at least one aperture sealed with a membrane (36). The membrane (36) is adapted to withstand a vacuum, and is permeable to electrons, and the interior of the chamber (34) is isolated from the vacuum. The chamber is useful for allowing wet samples (32) including living cells to be viewed under the electron microscope. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008171830(A) 申请公布日期 2008.07.24
申请号 JP20080097275 申请日期 2008.04.03
申请人 YEDA RESEARCH & DEVELOPMENT CO LTD;EL-MUL TECHNOLOGIES LTD 发明人 MOSES ELISHA;ZIK ORY;THIBERGE STEPHAN
分类号 G01N23/225;H01J37/20;G01N1/28;G01N23/00;G01N23/227;G21K7/00;H01J37/16;H01J37/28 主分类号 G01N23/225
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