发明名称 |
DEVICE AND METHOD FOR EXAMINATION OF SAMPLE IN NON-VACUUM ENVIRONMENT USING SCANNING ELECTRON MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To provide a chamber suitable for use with a scanning electron microscope useful for allowing wet samples to be viewed under an electron microscope. SOLUTION: The chamber (34) is suitable for use with the scanning electron microscope. The chamber contains at least one aperture sealed with a membrane (36). The membrane (36) is adapted to withstand a vacuum, and is permeable to electrons, and the interior of the chamber (34) is isolated from the vacuum. The chamber is useful for allowing wet samples (32) including living cells to be viewed under the electron microscope. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008171830(A) |
申请公布日期 |
2008.07.24 |
申请号 |
JP20080097275 |
申请日期 |
2008.04.03 |
申请人 |
YEDA RESEARCH & DEVELOPMENT CO LTD;EL-MUL TECHNOLOGIES LTD |
发明人 |
MOSES ELISHA;ZIK ORY;THIBERGE STEPHAN |
分类号 |
G01N23/225;H01J37/20;G01N1/28;G01N23/00;G01N23/227;G21K7/00;H01J37/16;H01J37/28 |
主分类号 |
G01N23/225 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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