发明名称 |
POLISHING PAD CONDITIONER IN CHEMICAL MECHANICAL POLISHING APPARATUS |
摘要 |
A polishing pad conditioner of a CMP apparatus is provided to obtain CoO(Cost of Ownership) margin and to improve uniformity of the polishing pad by conditioning the polishing pad using a sonic generator. A polishing pad conditioner comprises a sonic generator(316), a holder(320), and a driving source(322). The sonic generator is polished to the polishing pad by a sound wave while reciprocating and rotating accordance with radius direction of the polishing pad. The holder of the sonic generator capable of moving up and down is supported to the sonic generator. The power for driving the holder is generated by the driving source.
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申请公布号 |
KR20080061966(A) |
申请公布日期 |
2008.07.03 |
申请号 |
KR20060137181 |
申请日期 |
2006.12.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
PARK, JUM YONG;PARK, HYUNG SOON;SHIN, JONG HAN;RYO, CHEOL HWI;KIM, SUNG JUN |
分类号 |
H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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