发明名称 Remote plasma apparatus for processing substrate with two types of gases
摘要 In a plasma CVD apparatus, a plate formed with a plurality of perforated holes is arranged to separate a plasma generation region and a processing region. The aperture ratio of the perforated holes to the plate is not greater than five percent. Plasma including radicals and excited species is generated from an oxygen (O<SUB>2</SUB>) gas in the plasma generation region, then the radicals and excited species flow into the processing region through the perforated holes. A monosilane (SiH<SUB>4</SUB>) gas is also supplied into the processing region, but the backward flow of the monosilane gas into the plasma generation region is suppressed by the plate. In the processing region, the radicals and the excited species and the monosilane gas result in a gas phase reaction that yields the silicon dioxide film formed on the substrate or the wafer with high quality.
申请公布号 US7392759(B2) 申请公布日期 2008.07.01
申请号 US20040978150 申请日期 2004.10.29
申请人 NEC CORPORATION;CANON ANELVA CORPORATION 发明人 YUDA KATSUHISA;NOGAMI HIROSHI
分类号 H01L21/00;H01L21/31;C23C16/44;C23C16/452;C23C16/455;H01L21/205 主分类号 H01L21/00
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