发明名称 |
Integrated optoelectronic system for measuring fluorescence or luminescence emission decay |
摘要 |
An optoelectronic system for measuring fluorescence or luminescence emission decay, including (a) a light source being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit comprising at least one circuit causing the light source to emit light pulses towards a sample which causes a fluorescence or luminescence emission from the sample; (c) a photodiode detecting the emission; (d) a second integrated circuit comprising a detection analysis system determining information about the sample by analyzing decay of the detected emission; and (e) an enclosure enclosing the light source, the first integrated circuit, the second integrated circuit and the photodiode.
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申请公布号 |
US7391512(B2) |
申请公布日期 |
2008.06.24 |
申请号 |
US20040017748 |
申请日期 |
2004.12.22 |
申请人 |
AVAGO TECHNOLOGIES GENERAL IP PTE. LTD. |
发明人 |
FOUQUET JULIE E;HARDCASTLE IAN;HELBING RENE P;GROT ANNETTE C.;PETRILLA JOHN FRANCIS |
分类号 |
G01N21/64;G01J1/58;G01J3/443 |
主分类号 |
G01N21/64 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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