发明名称 Method and apparatus for extending lifetime reliability of digital logic devices through removal of aging mechanisms
摘要 An apparatus for extending lifetime reliability of CMOS circuitry includes a first switching device between a logic high supply rail/logic low supply rail, and a virtual supply rail coupled to the CMOS circuitry. In a first mode of operation the first switching device supplies the full voltage value between the logic high supply rail and the logic low supply rail, and in a second mode of operation, the first switching device isolates the virtual supply rail from the logic high supply rail/logic low supply rail, thereby reducing the voltage supplied to the CMOS circuitry. A second switching device coupled between the virtual supply rail and the logic low supply rail/logic high supply rail, in a third mode of operation, equalizes the voltage on the virtual supply rail and the logic low supply rail/logic high supply rail.
申请公布号 US7391233(B1) 申请公布日期 2008.06.24
申请号 US20070928232 申请日期 2007.10.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BOSE PRADIP;SHIN JEONGHEE;ZYUBAN VICTOR
分类号 H03K17/16;G05F3/02 主分类号 H03K17/16
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