发明名称 NITRIDE SEMICONDUCTOR SUBSTRATE AND MANUFACTURING METHOD THEREOF
摘要 A nitride semiconductor substrate and a method for manufacturing the same are provided to prevent the warpage of a substrate and the crack of a nitride semiconductor layer due to a thermal deformation by varying a pitch between trenches, or a width and depth of the trenches. A plurality of first trenches(11) are formed on one surface of a base substrate(10). The first trenches are parallel with each other in a first direction. A nitride semiconductor layer(20) is formed on the other surface of the base substrate opposite to the one surface on which the first trenches are formed. A pitch between two of the first trenches is progressively decreased from a center section of the base substrate to an edge section thereof. A plurality of second trenches are formed on the base substrate in a second direction intersected with the first direction. The second trenches are parallel with each other in the second direction.
申请公布号 KR20080056347(A) 申请公布日期 2008.06.23
申请号 KR20060129128 申请日期 2006.12.18
申请人 SILTRON INC. 发明人 KIM, DOO SOO;LEE, HO JUN;KIM, YONG JIN;LEE, DONG KUN
分类号 H01L21/20;C23C16/01;C23C16/34;C30B25/18;C30B29/38 主分类号 H01L21/20
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