发明名称 |
NITRIDE SEMICONDUCTOR SUBSTRATE AND MANUFACTURING METHOD THEREOF |
摘要 |
A nitride semiconductor substrate and a method for manufacturing the same are provided to prevent the warpage of a substrate and the crack of a nitride semiconductor layer due to a thermal deformation by varying a pitch between trenches, or a width and depth of the trenches. A plurality of first trenches(11) are formed on one surface of a base substrate(10). The first trenches are parallel with each other in a first direction. A nitride semiconductor layer(20) is formed on the other surface of the base substrate opposite to the one surface on which the first trenches are formed. A pitch between two of the first trenches is progressively decreased from a center section of the base substrate to an edge section thereof. A plurality of second trenches are formed on the base substrate in a second direction intersected with the first direction. The second trenches are parallel with each other in the second direction.
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申请公布号 |
KR20080056347(A) |
申请公布日期 |
2008.06.23 |
申请号 |
KR20060129128 |
申请日期 |
2006.12.18 |
申请人 |
SILTRON INC. |
发明人 |
KIM, DOO SOO;LEE, HO JUN;KIM, YONG JIN;LEE, DONG KUN |
分类号 |
H01L21/20;C23C16/01;C23C16/34;C30B25/18;C30B29/38 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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