发明名称 Contact Pin Probe Card and Electronic Device Test Apparatus Using Same
摘要 A contact pin ( 50 ) for contacting a terminal of a wafer and supplying a signal to that wafer is provided with a first conductive layer ( 51 b) composed of a first conductive material having a relatively higher hardness than the oxide film formed on the terminal of the wafer, a second conductive layer ( 51 c) composed of a second conductive material having a relatively lower hardness than the oxide film, and a base material ( 51 a) with the first conductive layer ( 51 b) and second conductive layer ( 51 c) formed at the outside, the first conductive layer ( 51 b) being formed so as to closely contact the outside of the second conductive layer ( 51 c), the first conductive layer ( 51 b) and second conductive layer ( 51 c) both being exposed at the front end face ( 50 a) of the contact pin ( 50 ).
申请公布号 US2008143366(A1) 申请公布日期 2008.06.19
申请号 US20040566463 申请日期 2004.12.14
申请人 KUROTORI FUMIO;ISHIKAWA TAKAJI;SAITO TADAO 发明人 KUROTORI FUMIO;ISHIKAWA TAKAJI;SAITO TADAO
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
主权项
地址