Arrangement and method for testing a capacitance array in an integrated circuit

摘要

An arrangement for testing a plurality of capacitances in a capacitance array of an integrated circuit includes a power supply and a means for cyclically charging and discharging at least one of the capacitances. In this arrangement, the cycle frequency is dependent on the value of the capacitance. The cycle frequency or a quantity characteristic associated therewith is measured by a means to ascertain a value of the capacitance under test.