发明名称 LASER-BASED PHOTO-ENHANCED TREATMENT OF DIELECTRIC, SEMICONDUCTOR AND CONDUCTIVE FILMS
摘要 A metallic, semiconductor, dielectric or oxide layer, such as a thin gate oxide, is formed by supplying a wafer in a processing chamber with thermal energy to heat the wafer and light energy, such as laser light at a selected wavelength, to improve the quality of the resulting layer. The laser light may be focused and/or scanned to control the depth and spatial extent of laser processing.
申请公布号 US2008132045(A1) 申请公布日期 2008.06.05
申请号 US20070741300 申请日期 2007.04.27
申请人 YOO WOO SIK 发明人 YOO WOO SIK
分类号 H01L21/20;C23C16/00;H01L21/31;H01L21/4763 主分类号 H01L21/20
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