发明名称 |
Offset-gate-type semiconductor device |
摘要 |
A semiconductor device includes a first semiconductor region (30) having a first conductivity type, a second semiconductor region (31) formed on the first semiconductor region (30) and having the first conductivity type, a third semiconductor region (34, 35) formed in a surface of the second semiconductor region (31) and having a second conductivity type, a fourth semiconductor region (33) formed in the surface of the second semiconductor region (31) and having the second conductivity type, and a gate structure (36, 37) formed on the second and fourth semiconductor region (31, 33). The semiconductor device further includes a conductive member (39) arranged in the trench (38) extending from a surface of the fourth semiconductor region (33) to the first semiconductor region (30), the trench (38) having one sidewall surface flush with a sidewall surface of the gate structure (36, 37). |
申请公布号 |
EP1215731(A3) |
申请公布日期 |
2008.06.04 |
申请号 |
EP20010129323 |
申请日期 |
2001.12.14 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
YASUHARA, NORIO;ONO, SYOTARO;NAKAMURA, KAZUTOSHI;KAWAGUCHI, YUSUKE;HODAMA, SHINICHI;NAKAGAWA, AKIO |
分类号 |
H01L29/78;H01L21/265;H01L21/336;H01L29/06;H01L29/10;H01L29/40;H01L29/417;H01L29/45 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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