发明名称 Offset-gate-type semiconductor device
摘要 A semiconductor device includes a first semiconductor region (30) having a first conductivity type, a second semiconductor region (31) formed on the first semiconductor region (30) and having the first conductivity type, a third semiconductor region (34, 35) formed in a surface of the second semiconductor region (31) and having a second conductivity type, a fourth semiconductor region (33) formed in the surface of the second semiconductor region (31) and having the second conductivity type, and a gate structure (36, 37) formed on the second and fourth semiconductor region (31, 33). The semiconductor device further includes a conductive member (39) arranged in the trench (38) extending from a surface of the fourth semiconductor region (33) to the first semiconductor region (30), the trench (38) having one sidewall surface flush with a sidewall surface of the gate structure (36, 37).
申请公布号 EP1215731(A3) 申请公布日期 2008.06.04
申请号 EP20010129323 申请日期 2001.12.14
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 YASUHARA, NORIO;ONO, SYOTARO;NAKAMURA, KAZUTOSHI;KAWAGUCHI, YUSUKE;HODAMA, SHINICHI;NAKAGAWA, AKIO
分类号 H01L29/78;H01L21/265;H01L21/336;H01L29/06;H01L29/10;H01L29/40;H01L29/417;H01L29/45 主分类号 H01L29/78
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