发明名称 SPECIMEN ANALYZER AND SPECIMEN ANALYTICAL METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an analyzer and an analytical method capable of restraining an influence of a frequency characteristic in a detecting part side to a low level, and capable of acquiring information of a specimen by a change of a propagation time of an electromagnetic wave. <P>SOLUTION: This analyzer has a generation part 101 for generating a terahertz wave, a signal generation part 107 for generating an optional code pattern, a delay part 108, a band diffusion part 105, a detecting part 102, and a band restoration part 106. The delay part 108 delays the code pattern generated from the signal generation part 107. The band diffusion part 105 changes a phase of the terahertz wave generated from the generation part 101 to diffuse a band, by the code pattern output from the signal generation part 107. The detecting part 102 detects the terahertz wave with the propagation time changed by the specimen. The band restoration part 106 changes the phase of the terahertz wave before detected by the detecting part 102, by the code pattern output from the delay part 108. <P>COPYRIGHT: (C)2008,JPO&INPIT</p>
申请公布号 JP2008122306(A) 申请公布日期 2008.05.29
申请号 JP20060308711 申请日期 2006.11.15
申请人 CANON INC 发明人 ITSUJI TAKEAKI
分类号 G01N21/35;G01N21/3586 主分类号 G01N21/35
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