发明名称 ABNORMALITY DETECTING DEVICE FOR STORAGE ELEMENT, ABNORMALITY DETECTING METHOD FOR STORAGE ELEMENT, AND ABNORMALITY DETECTING PROGRAM FOR STORAGE ELEMENT
摘要 PROBLEM TO BE SOLVED: To provide an abnormality detecting device for a storage element, capable of enhancing the accuracy in detecting the abnormality of the storage element, and an abnormality detecting method for the storage element and an abnormality detecting program for the storage element. SOLUTION: The abnormality detecting device 500 for the storage element comprises at least an equalization processing section 504, an abnormality judging section 510, a voltage measuring section 501, and a control unit 520. If capacity variations in storage element blocks B1, B2, ..., and BN are produced, the control unit 520 instructs an equalization processing to the equalization processing section 504. The abnormality judging section 510 judges the abnormality of the storage element blocks B1, B2, ..., and BN by using the voltage between the terminals of the respective storage element blocks B1, B2, ..., and BN left untouched after a predetermined lapse of time from the moment when the equalization processing is completed. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008118777(A) 申请公布日期 2008.05.22
申请号 JP20060299364 申请日期 2006.11.02
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 IIDA TAKUMA
分类号 H02J7/00;H01M10/44;H01M10/48;H02J7/02;H02J7/10 主分类号 H02J7/00
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