发明名称 TEST APPARATUS AND METHOD FOR BROADBAND WIRELESS ACCESS SYSTEM
摘要 A test apparatus for a broadband wireless access system and a method thereof are provided to configure an outer loop power control function through simpler test environment, change a CINR more easily and monitor a transmission time of a power control message, thereby previously preventing faults generated in the system. Test equipment comprises a tester, a base station, a terminal, a noise generator and a monitor. The tester receives an uplink signal from the terminal, and controls a CINR(Carrier to Interference and Noise Ratio) of the uplink signal according to system time synchronization before outputting the controlled signal. The monitor monitors modem operations of the base station. The monitor verifies a power control function by calculating a time difference between the CINR control time and transmission time of a power control message. The tester comprises a switch(200), a fixed attenuator(202), a coupler, an attenuation value controller(206), and a variable attenuator. The fixed attenuator attenuates the uplink signal from the terminal as much as a preset fixed value corresponding to an MCS level. The coupler couples the signal from the fixed attenuator with a preset noise signal. The variable attenuator attenuates the signal from the coupler as much as a specific value according to administrator setup, and outputs the attenuated signal to the base station.
申请公布号 KR20080041449(A) 申请公布日期 2008.05.13
申请号 KR20060109564 申请日期 2006.11.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHAE, JUNG KEE
分类号 H04B7/14;H04B7/24;H04B17/00 主分类号 H04B7/14
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