| 摘要 |
PROBLEM TO BE SOLVED: To shorten transfer time by preventing pattern object data from increasing even if test terminals are allocated to a DUT at will. SOLUTION: In this device test system, a server 80 includes a pattern generation part 214 for generating the pattern object data which are pattern data on one or more DUTs 140 written as time-series data in units of device terminals, and a server transmission part 218 for transmitting the object data to a device tester. The device tester 100 includes a tester reception part 250 for receiving the object data, and a pattern dispersion part 256 for dispersing the received object data in units of device terminals among pattern memories 258 so that the data can be processed on a time-series basis. COPYRIGHT: (C)2008,JPO&INPIT
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