发明名称 Gate stack engineering by electrochemical processing utilizing through-gate-dielectric current flow
摘要 A method is provided for electroplating a gate metal or other conducting or semiconducting material directly on a dielectric such as a gate dielectric. The method involves selecting a substrate, dielectric layer, and electrolyte solution or melt, wherein the combination of the substrate, dielectric layer, and electrolyte solution or melt allow an electrochemical current to be passed from the substrate through the dielectric layer into the electrolyte solution or melt. Methods are also provided for electrochemical modification of dielectrics utilizing through-dielectric current flow.
申请公布号 US7368045(B2) 申请公布日期 2008.05.06
申请号 US20050050790 申请日期 2005.01.27
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 VEREECKEN PHILIPPE M.;BASKER VEERARAGHAVAN S.;CABRAL, JR. CYRIL;COOPER EMANUEL I.;DELIGIANNI HARIKLIA;FRANK MARTIN M.;JAMMY RAJARAO;PARUCHURI VAMSI KRISHNA;SAENGER KATHERINE L.;SHAO XIAOYAN
分类号 C25D5/02;C25D11/04 主分类号 C25D5/02
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