发明名称 INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce cost by omitting expensive function while keeping inspection precision. SOLUTION: This inspecting device, conducting an electric inspection by contacting an electrode of a panel with a probe, comprises: a supporting mechanism positioning and supporting the panel; a contact mechanism contacting each electrode of the panel with each probe; and a control part conducting an electric inspection by contacting each electrode of the panel with each probe. The control part include processes of: determining the position of the panel by abutting the panel, by driving a pusher of the supporting mechanism, on the positioning pin; determining whether the contact is possible or not by recognizing the panel positioning using an alignment camera; displaying manual re-adjustment by the supporting mechanism when the contact is determined impossible; and delivering each probe to each electrode by the contact mechanism when the contact of the panel is possible. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008101938(A) 申请公布日期 2008.05.01
申请号 JP20060282834 申请日期 2006.10.17
申请人 MICRONICS JAPAN CO LTD 发明人 KOSAKA YUTAKA;OTSU SUSUMU
分类号 G01R31/00;G02F1/13;G09F9/00 主分类号 G01R31/00
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