| 摘要 |
A test socket is provided to easily remove the oxide layer of a lead terminal even by small pressure by including a contact pin whose contact pressure with a lead terminal of an electronic component is increased. A protrusion part(123a) is formed on the upper end of each contact pin(123) of a test socket including a plurality of contact pins electrically connected to test equipment for testing an electronic component(30), coming in contact with a lead terminal(31) of the electronic component and lengthily extended in one direction wherein the height of the protrusion part gradually decreases as it goes to the one direction. The lengthwise direction of the protrusion part is vertical to the lengthwise direction of the lead terminal. A plurality of protrusion parts are disposed along the lengthwise direction of the lead terminal so that the section of the protrusion cut along the lengthwise direction of the lead terminal is of a continuously connected mountain type.
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