发明名称 METHOD AND SYSTEM FOR EARLY Z TEST IN THREE-DIMENSIONAL IMAGE RENDERING
摘要 PROBLEM TO BE SOLVED: To provide a method and system for an early Z test which eliminates performing of rasterization in a tile unit with respect to a three-dimensional model not displayed from a user, and consequently simplifies an arithmetic operation required for rendering, in a tile-based three-dimensional rendering. SOLUTION: The early Z test method includes: segmenting a scene into a plurality of tiles; selecting one from among a plurality of triangles constituting a three-dimensional model of a rendering object and selecting a first tile which has a tile Z value less than a minimum Z value of the selected triangle from among the plurality of tiles; and performing rendering with respect to a selected triangle in remaining triangles excluding the first tile. The minimum Z value of each triangle is preferably equal to the minimum value among Z values of three vertexes of the triangle. The tile Z value of each tile is preferably equal to the minimum value among respective maximum Z values of triangles that completely include the tile. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008077627(A) 申请公布日期 2008.04.03
申请号 JP20070093766 申请日期 2007.03.30
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 MIN KYOUNG JUNE;KIM JONG MYON;KIM HEE SEOK;KIM JEONG WOOK;KIM SUK JIN
分类号 G06T15/40 主分类号 G06T15/40
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