发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 <p>A method for manufacturing a semiconductor device is provided to prevent inter-gate interference by minimizing a step of a device isolation layer. A method for manufacturing a semiconductor device comprises providing a semiconductor substrate(21) divided into an active region and a device isolation region in which a trench type device isolation layer(24a) is formed; forming a groove in a gate formation region of the active region including the device isolation layer forming a sacrifice layer at an entire surface of the substrate to bury the groove; planarizing the sacrifice layer and the device isolation layer to expose a surface of the active region removing the sacrifice layer remaining in the groove of the active region; and forming a gate on a gate formation region of the active region including the device isolation layer in which the groove is formed.</p>
申请公布号 KR20080029673(A) 申请公布日期 2008.04.03
申请号 KR20060096551 申请日期 2006.09.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 SONG, SEOK PYO;SHEEN, DONG SUN;AHN, SANG TAE;AN, HYEON JU
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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