发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<p>A method for manufacturing a semiconductor device is provided to prevent inter-gate interference by minimizing a step of a device isolation layer. A method for manufacturing a semiconductor device comprises providing a semiconductor substrate(21) divided into an active region and a device isolation region in which a trench type device isolation layer(24a) is formed; forming a groove in a gate formation region of the active region including the device isolation layer forming a sacrifice layer at an entire surface of the substrate to bury the groove; planarizing the sacrifice layer and the device isolation layer to expose a surface of the active region removing the sacrifice layer remaining in the groove of the active region; and forming a gate on a gate formation region of the active region including the device isolation layer in which the groove is formed.</p> |
申请公布号 |
KR20080029673(A) |
申请公布日期 |
2008.04.03 |
申请号 |
KR20060096551 |
申请日期 |
2006.09.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
SONG, SEOK PYO;SHEEN, DONG SUN;AHN, SANG TAE;AN, HYEON JU |
分类号 |
H01L21/336;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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