发明名称
摘要 PROBLEM TO BE SOLVED: To obtain a monomr as a raw material of a polymer for resist material, having excellent properties in all of adhesion, transparency and etching resistance, in a photolithography using a light having wave length shorter than 3000 nm, especially using Ar-F excimer laser light as the light source, and the polymer thereof, the resist material containing the polymer as the base resin, and to provided a method for forming patterns by using the resist material. SOLUTION: The (meth)acrylate compound is represented by formula (1) [wherein, R<1> shows hydrogen atom or methyl group]. [formula (1)].
申请公布号 JP4071021(B2) 申请公布日期 2008.04.02
申请号 JP20020081323 申请日期 2002.03.22
申请人 发明人
分类号 C07D307/93;G03F7/027;C07D307/00;C08F20/28;G03F7/039;H01L21/027 主分类号 C07D307/93
代理机构 代理人
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