| 摘要 |
In an X-ray source in which an electron beam spot is focused on a rotating anode, the height of the electron beam spot is reduced as much as practical, the width is increased so that the ratio of the height to the width of the electron beam spot is significantly smaller then the sine of the X-ray takeoff angle. The electron beam is generated by an electron optical configuration obtained by a process involving a combination of testing and simulations. An initial electron optics design is obtained by simulating the electron optics using conventional simulation software. This initial electron optical design is then built into hardware. Extensive measurements are then made on this hardware, and, based on the results of the measurements, new simulations are performed. This process is repeated until an optimum design is obtained.
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