发明名称 NONVOLATIBLE MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 <p>A nonvolatile memory device and a method for fabricating the same are provided to prevent mis-alignment due to photolithography by implementing a spacer typed floating gate at a protruded source region. A nonvolatile memory device includes a source region(160) and a memory transistor. The source region is formed by extruding at an active region of a semiconductor substrate. The memory transistor includes a floating gate(110b), a dielectric(112b), and a control gate(114b). The floating gate is formed by arranging at a side wall of the source region. The dielectric is formed on the floating gate by overlapping with a part of the source region. The control gate is formed on the dielectric.</p>
申请公布号 KR20080025560(A) 申请公布日期 2008.03.21
申请号 KR20060090190 申请日期 2006.09.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, KWANG TAE;HAN, JEON GUK;YU, TEA KWANG;PARK, JI HOON;HONG, EUN MI
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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