NONVOLATIBLE MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME
摘要
<p>A nonvolatile memory device and a method for fabricating the same are provided to prevent mis-alignment due to photolithography by implementing a spacer typed floating gate at a protruded source region. A nonvolatile memory device includes a source region(160) and a memory transistor. The source region is formed by extruding at an active region of a semiconductor substrate. The memory transistor includes a floating gate(110b), a dielectric(112b), and a control gate(114b). The floating gate is formed by arranging at a side wall of the source region. The dielectric is formed on the floating gate by overlapping with a part of the source region. The control gate is formed on the dielectric.</p>
申请公布号
KR20080025560(A)
申请公布日期
2008.03.21
申请号
KR20060090190
申请日期
2006.09.18
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
KIM, KWANG TAE;HAN, JEON GUK;YU, TEA KWANG;PARK, JI HOON;HONG, EUN MI