| 摘要 |
PROBLEM TO BE SOLVED: To provide an integrated circuit device or the like in which the improvement in yield is made possible while an area increase can be minimized. SOLUTION: The integrated circuit device includes a data driver DB, a memory block MB, an information storage block ISB in which the address of a defective cell of the memory block MB is programmed as the defective address and is stored, and a switching control circuit SC which performs the control to switch the access to the defective cell to the access to a redundant cell. The switching control circuit SC performs the control to switch the access to the defective cell to the access to a redundant cell by comparing the row address and the defective address of the display panel access during display panel accessing and comparing the load address of a host access and the low address and defective address of the row address during host accessing. COPYRIGHT: (C)2008,JPO&INPIT
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