| 摘要 |
PROBLEM TO BE SOLVED: To provide a sample analysis method, a sample analyzer and a program capable of analyzing a sample more accurately than by measuring from one direction. SOLUTION: A light is irradiated by a measuring device from the translucent substrate side, and a polarization state of light, reflected by an organic EL element panel 50, is measured. Meanwhile, the light is irradiated by a measuring device, from the cover member side located opposite to the translucent substrate, and the polarization state of light reflected by the organic EL element panel 50 is measured. An analysis part reads out a substrate side model and a cover side model, corresponding to each measurement from both directions. The analysis part calculates the theoretical polarization state of the light, based on the substrate side model and the theoretical polarization state of light, based on the cover side model, respectively. The analysis part performs fitting, based on the calculated polarization state of light based on the substrate side model, the calculated polarization state of light based on the cover side model, the polarization state measured from the substrate side, and the polarization state measured from the cover side. COPYRIGHT: (C)2008,JPO&INPIT
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