发明名称 Semiconductor device and method of manufacturing the same
摘要 The method includes the steps of forming an upper electrode of a capacitor by patterning a second conductive film; forming a capacitor dielectric film by patterning a ferroelectric film; and forming a lower electrode by patterning a first conductive film. A step of forming the first conductive film includes the steps of forming a lower conductive layer made of a noble metal other than iridium over a first interlayer insulating film; and forming an upper conductive layer made of a conductive material, which is different from a material for the lower conductive layer, and which is other than platinum.
申请公布号 US2008054328(A1) 申请公布日期 2008.03.06
申请号 US20060646443 申请日期 2006.12.28
申请人 FUJITSU LIMITED 发明人 WANG WENSHENG
分类号 H01L29/94;H01L21/8242 主分类号 H01L29/94
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