| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing method for enabling a semiconductor device to have the information reflecting a test result of the device even for the semiconductor device not mounting a nonvolatile memory, or even if the nonvolatile memory is not used. SOLUTION: A plurality of presumed inking positions are preset to an LSI 10, a test is conducted to the LSI 10, actual inking positions are selected from a plurality of presumed inking positions in accordance with the test result, and the actual inking (i1, i2) is sequentially conducted by moving an inker A to the selected inking positions. Characteristic administration for each chip corresponding to the test result can be done easily, and a plurality of specification certificates can be enabled in accordance with the actual performance. COPYRIGHT: (C)2008,JPO&INPIT
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