发明名称 Method and device for the subjective determination of aberrations of higher order
摘要 A device for the subjective determination of aberrations of higher orders Xi in an optical system, in particular in an eye includes at least one observation channel into which defined plates can be introduced, the individual plates having optically active structures which correspond to a defined Zernike polynomial and to a defined amplitude, at least one order Xi of the Zemike polynomial being greater than two.
申请公布号 US7338173(B2) 申请公布日期 2008.03.04
申请号 US20040470149 申请日期 2004.01.12
申请人 CARL ZEISS MEDITEC AG 发明人 DICK MANFRED;SCHROEDER ECKHARD;MAEUSEZAHL HOLGER
分类号 A61B3/00;A61B3/04 主分类号 A61B3/00
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