发明名称 Methods and apparatus for testing circuit boards
摘要 A method includes placing a circuit board on a test sheet so that conductive pins on an underside of the circuit board are in electrically conductive contact with electrically conductive contact pads on an upper surface of the test sheet. The test sheet includes connectors at a periphery of the test sheet. The connectors couple the test sheet to test signal generating devices. The method further includes applying test signals to the circuit board via the test sheet. Other embodiments are described and claimed.
申请公布号 US7339368(B2) 申请公布日期 2008.03.04
申请号 US20040895600 申请日期 2004.07.21
申请人 INTEL CORPORATION 发明人 KREAGER DOUGLAS P.
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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