发明名称 Method and system of self-test for a single infrared machine
摘要 A system and method of self-test for a single infrared machine. An infrared transimit circuit may be set up succesfully by only using a host with an external infrared module without a use of another test machine. A test procedure is excuted through the infrared transmit circuit to ascertain the function of the infrared module in the host is properly functioning.
申请公布号 US7337376(B2) 申请公布日期 2008.02.26
申请号 US20040860952 申请日期 2004.06.04
申请人 INVENTEC CORPORATION 发明人 HUANG CHUNG-WEN;CHAO SHUN-HSIEN
分类号 G01R31/28;G01D18/00;H04B10/10 主分类号 G01R31/28
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