发明名称 |
Method and system of self-test for a single infrared machine |
摘要 |
A system and method of self-test for a single infrared machine. An infrared transimit circuit may be set up succesfully by only using a host with an external infrared module without a use of another test machine. A test procedure is excuted through the infrared transmit circuit to ascertain the function of the infrared module in the host is properly functioning.
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申请公布号 |
US7337376(B2) |
申请公布日期 |
2008.02.26 |
申请号 |
US20040860952 |
申请日期 |
2004.06.04 |
申请人 |
INVENTEC CORPORATION |
发明人 |
HUANG CHUNG-WEN;CHAO SHUN-HSIEN |
分类号 |
G01R31/28;G01D18/00;H04B10/10 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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