发明名称 Isolation trenches for memory devices
摘要 Methods and apparatus are provided. A first dielectric plug is formed in a portion of a trench that extends into a substrate of a memory device so that an upper surface of the first dielectric plug is recessed below an upper surface of the substrate. The first dielectric plug has a layer of a first dielectric material and a layer of a second dielectric material formed on the layer of the first dielectric material. A second dielectric plug of a third dielectric material is formed on the upper surface of the first dielectric plug.
申请公布号 US7332408(B2) 申请公布日期 2008.02.19
申请号 US20040878805 申请日期 2004.06.28
申请人 MICRON TECHNOLOGY, INC. 发明人 VIOLETTE MICHAEL
分类号 H01L21/76;H01L21/762;H01L21/8238;H01L21/8247;H01L29/788 主分类号 H01L21/76
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